XPS and Raman Studies on (002) Oriented Nanocrystalline ZnO Films Showing Temperature Dependent Optical Red Shift
نویسنده
چکیده
Nanocrystalline zinc oxide (ZnO) thin films have been prepared on glass substrates at different temperatures through planar RF-magnetron sputtering. Structural properties with respect to substrate temperature have been studied with xray diffraction (XRD) patterns. The stoichiometry in the films is studied with X-ray photoemission spectroscopy (XPS). The shifts in the absorption edge of the films in the optical spectrum with the variation of substrate temperature are examined. Raman spectrum showed an increase in the average scattering intensity of the phonon peak at 580 cm with respect to the reduction of particle size. The variation of conductivity of prepared ZnO films with respect to substrate temperature is studied well.
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